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Aging And Dielectric Response Of NaYF4 Thin Films

M.V.Ramana Reddy and Katta Narasimha Reddy

Sodium Yttrium Fluoride thin films were prepared by vacuum thermal evaporation under vacuum (10-5 torr). Thickness of the films were measured by Tolansky’s interferometric technique. Variation of the effect of aging, AC voltage with capacitance and loss tangent were studied. The time dependent decay behaviour of the thin film capacitor at a given AC voltage and also the percentage variation of capacitance with frequency were studied and the results were discussed. ï›™ 2006 Trade Science Inc. - INDIA